Characterization Methodology for Persistence and Anti-Persistence in IR Detectors for the Euclid and SVOM Missions

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This methodology quantifies pixel persistence and anti-persistence in infrared detectors by analyzing charge trapping behavior across various flux histories. By employing Savitzky–Golay filtering and differential ramps, the approach creates accurate pixel-level models for missions like Euclid and SVOM. These corrections mitigate biases and false detections, ensuring the precision of high-sensitivity astronomical imaging.