Control and Improvement of Wafer Bow in DIBS Deposited Thin Film Optical Stacks for Enhanced SNSPD Performance
Dr. Matthias Golling
Rhysearch
Day
Thursday · 2026-10-15
Time
3:20 PM - 4:20 PM
Session
Exhibition and Poster Session-4
Venue
ICSO 2026 Conference Venue
Track indicates the session hall. Refer to the on-site programme board for the exact room number and any last-minute room changes.
In 30 seconds
This dual ion beam sputtering (DIBS) process controls wafer bow in DBR mirrors to optimize the performance of superconducting nanowire single-photon detectors (SNSPDs). It creates ultra-smooth reflective surfaces required to maximize optical absorption without compromising superconducting nanowire properties. This advancement enhances detection efficiency and timing resolution for quantum communication and deep-space optical links.
Read the full paper
Access the complete technical paper via the official ICSO 2026 programme.
Topics & Subtopics
Source traceability
ID: icso26_357
Schedule facts reproduced from the published ICSO 2026 programme. Enrichment metadata is a discovery aid, not a scientific classification.