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PosterExperimental / Prototype

Control and Improvement of Wafer Bow in DIBS Deposited Thin Film Optical Stacks for Enhanced SNSPD Performance

Dr. Matthias Golling

Rhysearch

Day

Thursday · 2026-10-15

Time

3:20 PM - 4:20 PM

Session

Exhibition and Poster Session-4

Venue

ICSO 2026 Conference Venue

Session Exhibition and Poster Session-4

Track indicates the session hall. Refer to the on-site programme board for the exact room number and any last-minute room changes.

In 30 seconds

This dual ion beam sputtering (DIBS) process controls wafer bow in DBR mirrors to optimize the performance of superconducting nanowire single-photon detectors (SNSPDs). It creates ultra-smooth reflective surfaces required to maximize optical absorption without compromising superconducting nanowire properties. This advancement enhances detection efficiency and timing resolution for quantum communication and deep-space optical links.

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Topics & Subtopics

Quantum TechnologiesDeep-Space Optical CommunicationInstrument PerformanceSingle-Photon DetectionSingle-Photon DetectorsMirrorsOptical Materials

Source traceability

ID: icso26_357

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